| Issue | Fix Version | Assignee | Priority | Status | Resolution | Resolved In Build |
|---|---|---|---|---|---|---|
| JDK-8019105 | 7u45 | Erik Gahlin | P3 | Closed | Fixed | b01 |
| JDK-8013993 | 7u40 | Erik Gahlin | P3 | Closed | Fixed | b25 |
Today there are three general JFR GC event tests:
- TestGCEventExplicit
triggers many GCs by calling System.gc()
- TestGCEventImplict
triggers many GCs by allocating lot's of memory
- TestGCEventAll
triggers even more GC by doing what TestGCEventExplicit and TestGCEventImplict at the same time.
Since these tests run for all the different collectors they are very time consuming and the purpose of the unit tests is to verify the data, not stress the system, the TestGCEventAll shoud be sufficient.
- TestGCEventExplicit
triggers many GCs by calling System.gc()
- TestGCEventImplict
triggers many GCs by allocating lot's of memory
- TestGCEventAll
triggers even more GC by doing what TestGCEventExplicit and TestGCEventImplict at the same time.
Since these tests run for all the different collectors they are very time consuming and the purpose of the unit tests is to verify the data, not stress the system, the TestGCEventAll shoud be sufficient.
- backported by
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JDK-8013993 Remove JFR TestGCEventExplicit and TestGCEventImplict
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- Closed
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- Closed
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