Currently, the tests execute a serialization/deserialization cycle, which generates a lot of garbage. Some of the objects created should be handled on the EDT, and if the EDT is not fast enough, the test may run out of memory.

The test was updated by the following change:
https://github.com/openjdk/jdk/pull/29395/changes

Instead, the EDT should be flushed during execution to ensure that OOMs do not occur due to EDT overload, but only when there are actual memory leaks in Swing.